FEA Thermal-Electrical Stress Analysis


Perform FEA (Finite Element Analysis) coupled thermal-electrical stress analysis on the vehicle glass, which includes ITO (Indium Tin Oxide) film, glass, and conductive film. The aim is to determine electric voltage distribution, current density distribution, transient temperature, stress, deflection, and so forth at different time points. This analysis will help identify potential weak positions and provide suggestions for improvements.


During the thermal-electrical stress analysis, the vehicle glass is subjected to various temperature and electrical load conditions to simulate real-world operating scenarios. The evaluation of electric voltage distribution and current density distribution across the structure will help us understand the performance under different electrical load conditions. This is particularly important for the ITO film, which is often used for its excellent conductive properties.


Transient temperature, stress, and deflection responses under these conditions can reveal the structural behavior of the assembly. This way, we can identify potential weak spots in the structure that may be vulnerable to failure over time.

The insights gleaned from this analysis can be invaluable in guiding design modifications. If certain areas show excessive temperature, stress, or deflection responses, design changes can be made to enhance the durability and performance of the vehicle glass. Potential improvements may include adjusting the thickness of the layers, modifying the material properties, or altering the manufacturing processes.


By using FEA coupled thermal-electrical stress analysis, we can better understand the complex interactions within the vehicle glass assembly under various conditions. This, in turn, supports the development of a more robust, efficient, and reliable product.


Contact Us if you would like to run FEA thermal or electrical stress analysis on your projects.

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